Metrology: Statistical Analysis of Measurement Uncertainty

Apr

,

1

$150

Register

Metrology: Statistical Analysis of Measurement Uncertainty

Apr

1

-

Apr 1, 2020

$150

Presentation

Topic

How much trust to place in a given measurement can be quantified by determining the magnitude of each of those sources?

The webinar begins with an examination of the fundamental vocabulary and concepts related to metrology.

All measurement processes have some inherent variability; that is, a given measurement will likely not be exactly equal to the true value, because of variation from a number of different sources. Some of those sources are: person to person, equipment to equipment, time to time, and calibration to calibration.

Speaker

  • John N. Zorich, QA & QC Consultant

Agenda

  • When: Wednesday, April 1, 2020
  • Time: 10:00 AM – 1:00 PM
  • Uncertainty Budgets and Guard-banded Specifications
  • Fundamental Vocabulary & Concepts
  • Gage R&R (ANOVA method)
  • Gage Correlation
  • Gage Linearity
  • Gage Bias

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